Note: We will be attending the MM25 Conference in Salt Lake City from July 27–31, 2025.

Our Flagship Product: MIRA

MIRA Large Chamber SEM

MIRA - Large Chamber Scanning Electron Microscope

MIRA represents a breakthrough in electron microscopy, featuring an exceptionally large vacuum chamber that enables non-destructive analysis of complete components and large specimens.

This revolutionary design allows for in-situ testing and avoids destructive sample preparation, preserving valuable components while delivering advanced analytical capabilities across various industries.

Unmatched Sample Size

Accommodates samples up to 1500mm in diameter and 1500mm in height, enabling analysis of large components.

High Resolution Imaging

Advanced electron optics deliver better than 10nm resolution for detailed analysis of microstructures.

Versatile Analysis

Integrates EDS, EBSD, and optionally FIB & FT-IR for comprehensive material characterization.

MIRA Technical Specifications

Feature Specification
Resolution Better than 10nm
Magnification 10x - 300,000x
Acceleration Voltage 0.2 - 30keV
Detectors Channeltron (SE), 4-Quadrant (BSE)
Maximum Specimen Size Up to 1500 mm diameter, 1500 mm height
Maximum Specimen Mass 300 kg
Axes 5+1 axis system with micro-step control
Repetition Accuracy ±50 μm
Positioning Range (X) 600mm, 1000mm, 1500mm options
Positioning Range (Z) 600mm, 1000mm, 1500mm options
Positioning Range (A) 90°
Positioning Range (B) 135°
Positioning Range (C) 360°
Positioning Range (D) 350°
Standard Analytical EDS (Energy Dispersive X-Ray Spectroscopy), EBSD (Electron Backscatter Diffraction)
Optional Capabilities FIB (Focus Ion Beam), FT-IR (Fourier Transformed Infrared Spectrometer), Internal Camera System
Software MIRA Control System (Windows® based)
Hardware PC, monitors, Printer
Low Vacuum Pumps Rotary vane (65m³/h), Rotary lobe (400 m³/h)
High Vacuum Pump Turbo pump 2400 l/sec
Ultimate Vacuum Up to 10⁻⁶ mbar (achieved after ~45 minutes)
Vacuum Chamber Size Options 3m³, 9m³, 12m³

Applications in Space & Defense

Space Technology

MIRA enables comprehensive analysis of satellite components, propulsion systems, and thermal protection materials without compromising their structural integrity.

  • Non-destructive inspection of critical flight hardware
  • Material characterization for extreme space environments
  • Failure analysis of returned space components

Defense Applications

MIRA provides defense contractors with unparalleled capabilities for analyzing armor materials, weapon systems, and electronic components while maintaining security.

  • Complete analysis of composite armor systems
  • Non-destructive testing of guidance system components
  • Forensic analysis of materials under controlled conditions

About ELLCIE Industries

About image

Founded by Martin Klein, ELLCIE Industries GmbH has established itself as a leader in advanced microscopy solutions for the most demanding applications in space exploration and defense technology.

Our state-of-the-art production facility in Grevesmühlen, Germany, combines German engineering precision with cutting-edge innovation to deliver unparalleled analytical capabilities.

Technical Expertise

World-class team of engineers and scientists specializing in vacuum technology and electron microscopy.

Innovation Focus

Continuous R&D to push the boundaries of non-destructive testing and materials analysis.

Contact Us

Get in Touch

Our Location

ELLCIE Industries GmbH

Am Industriepark 2-10

23936 Grevesmühlen, Germany

Phone

+49 (0) 123 456 789

Email

info@ellcie-industries.com